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Showing results: 781 - 795 of 966 items found.

  • X-Ray Inspection Systems

    Sciencescope International

    Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.

  • Data Logger & Monitor

    DLM-09 - Manatronics Pty Ltd

    The Data Logger/Monitor has been designed to operate on 12V, 24V, 48V and 110V battery systems, with optional inputs for higher input Voltages, up to 550V. The Data Logger/Monitor is completely powered from the Batteries, and therefore a mains supply is not required. Therefore tests are not terminated part way through by a temporary mains power outage. The unit is lightweight and is completely portable. The Data Logger/Monitor may be left on site, unattended, for extended periods of time for data collection. Or used permanently as a Monitor / Alarm system.

  • MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz

    N5183B - Keysight Technologies

    Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation

  • Motor Test for Electric Scooters

    MOTOMEA

    *The performance data of electric motors, in the majority of all cases, is performed by a brake test. Power input is calculated from current and voltage. Torque and power output are measured with a brake. It is important to reach, for each point, a persistent temperature. In case of large outer rotor BLDC motors, which are usually used for electric scooters, this traditional procedure may take many hours to complete, and is very complicated. *For several years, an innovative motor tester of MEA Testing Systems Ltd. is on the market. This testing system avoids any temperature confusion by testing a motor at constant temperature over the entire speed range. The test procedure is very fast, and gives the full load performances, including PWM current, voltage, torque, and driver efficiency, from stall up to no load. *During the test procedure, the motor is freely accelerated from stall to no load speed. The load of the motor is only the predetermined inertia of the rotor. From the moment of inertia and the acceleration, the torque of the motor is calculated and, also, the power output over the whole speed is given. Since the entire measuring time, depending on the motor size, is usually less than one second, the motor has no time to warm up. It remains at room temperature.

  • Faraday Cages

    LBA Group, Inc

    LBA's EMFaraCage® faraday cages are EMI and RFI shielding boxes and RF test enclosures that bring convenience to device testing. Faraday cages are ideal for isolating critical systems in high field RF environments or wherever RF ingress or egress must be minimized. Security, production testing, biomedical research and semiconductor testing are only a few of the many areas where EMFaraCage® faraday shielded enclosures are employed. EMFaraCage® faraday cage enclosure systems are fully featured to support a wide variety of test missions. The standard faraday cages include effective power, dataline and RF signal isolation in large test volumes. EMFaraCage® faraday cages are much more affordable than shielded room solutions and offer the convenience of portability.

  • Automatic Metallic Pendulum Impact Testing Machine

    Jinan Testing Equipment IE Corporation

    JB-450/750A automatic type pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and is capable of doing a large number of impact tests continuously. The automatic type pendulum impact tester can display the impact power, impact toughness, and the pendulum's rotation angle. All the testing reports can be printed out. JB-450/750A can be equipped with fully automated sample feeding system, which greatly improves the test efficiency, and reduce labor intensity. The crygenic cooling device is available for impact tests under the lowest temperature down to -196 C. The automatic type pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.

  • True Average Connected Power Sensors

    CPS2000 - Boonton Electronics

    CPS2000 True Average Connected Power Sensors provide USB, LAN and PoE capabilities to enable easy RF power measurement of modulated and CW signals from 50 MHZ to 8 GHz. Compatible with Windows and Linux systems, CPS2000 sensors include all the necessary drivers for programming through SCPI, IVI and LabVIEW. Connectivity and compatibility, combined with 60 dB dynamic range and 100 measurements per second, CPS2000 sensors are the ideal solution for lab, field, production test, ATE remote monitoring and embedded environments.

  • AC DC High Voltage Divider

    Neutronics Manufacturing Co.

    NMC make products are the ideal equipment for HV measuring products are the ideal equipment for HV measuring instruments, apply in power system, electronic equipment factory to test frequency AC high voltage and DC high voltage. This product is composed by HV measuring part and LV display instrument. HV part and LV display instrument are separate when working, it is safe and reliable.

  • Pulsed SMU Systems

    Maury Microwave Corporation

    AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.

  • Insulation Resistance Meter

    AMIC-15k1 - Amperis sl

    *The partial discharge indicator PDI.*Diagnosis of insulation systems based on standard measurements of IR, DAR, PI, SV, RT, DD*Allows to test the electrical durability of the tested object - indication of breaking voltage.*The high resistance to electromagnetic interference ensures uninterrupted operation in power plants and near high-voltage transmission lines up to 1200 kV AC and 500 kV DC.

  • Launch Analyzer

    2440 - Photon Kinetics

    The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.

  • Zero-distance Drop Test System

    KRD40 series - CME Technology Co. Ltd.

    KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.

  • Earth Tester

    TAURUS PRECIOHM ET - Taurus Powertronics Systems

    The TAURUS PRECIOHM ET is one of the specially designed products by TAURUS to measure earth resistivity and earth resistance in a power station. These tests are performed based on 4 point (Wenner) and 3 point (fall of potential) methods respectively. All electrical equipment in the substation and power stations are electrically connected to station earth mat with earth electrodes. The earth electrode ensures that in the event over voltage on the system due to system fault or lighting discharges etc., the parts of the equipment which are normally ”dead” as far as voltages are concerned; do not attain dangerously high potentials. An earth electrode will only be effective so long it has a low resistance to the earth and can carry large currents without deteriorating. Thus the resistance of earth electrode should be low to give good protection and it must be continuously measured and monitored in all the substations and power stations.

  • DC Power Supply

    62000H - Chroma Systems Solutions, Inc.

    Chroma’s new 62000H Series of programmable DC Power Supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include a high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals, as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations. For high power applications, parallel up to 10 units for up to 150kW.

  • Multi-Wafer Test & Burn-in System

    FOX-XP - Aehr Test Systems

    The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.

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